Publication:

A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability

Date

2022
Journal article
https://doi.org/10.1109/TCSII.2021.3096885
Simple item page Full metadata Statistics
 
dc.contributor.authorCao, Xugang
dc.contributor.authorJiao, Hailong
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.accessioned2022-03-09T13:48:56Z
dc.date.available2022-03-09T13:48:56Z
dc.date.embargo2022-02-28
dc.date.issued2022
dc.description.wosFundingTextThis work was supported in part by the Natural Science Foundation of China under Grant 62074005, and in part by the Shenzhen Municipal Scientific Program under Grant KQJSCX20180323174729052. This brief was recommended by Associate Editor X. Li.
dc.identifier.doi10.1109/TCSII.2021.3096885
dc.identifier.issn1549-7747
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39399
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage554
dc.source.endpage558
dc.source.issue2
dc.source.journalIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
dc.source.numberofpages5
dc.source.volume69
dc.title

A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
BPSDRFF_final.pdf
Size:
683.95 KB
Format:
Adobe Portable Document Format
Description:
Accepted version
Download
Publication available in collections:
Articles