Publication:
A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability
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Acq. date: 2026-01-27
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562 since deposited on 2022-03-09
79last month
18last week
Acq. date: 2026-01-27
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1911 since deposited on 2022-03-09
Acq. date: 2026-01-27
Citations