Publication:
A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability
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Acq. date: 2026-04-26
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1911 since deposited on 2022-03-09
Acq. date: 2026-04-26
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Downloads
800 since deposited on 2022-03-09
68last month
15last week
Acq. date: 2026-04-26
Views
1911 since deposited on 2022-03-09
Acq. date: 2026-04-26
Citations