Browsing by author "Van Moer, W."

A first step towards a wave-based 'stochastic' calibration for multi-port vectorial network analyzers

Rolain, Y.; Van Moer, W.; DeGroot, D. (2004)

An automatic harmonic selection scheme based on spectrum analyzer measurements

Rabijns, Daan; Vandersteen, Gerd; Rolain, Y.; Van Moer, W.; Geens, A.; Schoukens, J. (2002)

An automatic harmonic selection scheme based on spectrum analyzer measurements

Rabijns, D.; Vandersteen, Gerd; Rolain, Y.; Van Moer, W.; Geens, A.; Schoukens, J. (2003)

An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyzer

Van Moer, W.; Rolain, Y.; Schoukens, J. (2002)

An improved algorithm to create spectrally pure signals

Rabijns, D.; Van Moer, W.; Vandersteen, Gerd (2005)

Bit-error-rate estimation for OFDM based telecommunication systems schemes in the presence of nonlinear distortions

Vandersteen, Gerd; Rolain, Yves; Van Moer, W.; Verbeeck, J.; Schoukens, J. (2000)

Block-oriented instrument software design

Rolain, Y.; Van Moer, W. (2004)

Building a differential signal source

Rabijns, D.; Van Moer, W.; Vandersteen, Gerd (2003)

Characterisation of multiport systems through 3-port LSNA measurements

Van Moer, W. (2003)

Characterisation of multiport systems through 3-port LSNA measurements

Van Moer, W.; Rolain, Y. (2003)

Creating spectrally pure signals for ADC-testing

Rabijns, D.; Van Moer, W.; Vandersteen, Gerd (2004)

Creating spectrally pure signals for ADC-testing

Rabijns, D.; Vandersteen, Gerd; Van Moer, W.; Rolain, Y.; Schoukens, J. (2003)

Determining the reciprocity of mixers through 3-port LSNA measurements

Van Moer, W.; Rolain, Y. (2003)

Estimation and validation of semi-parametric dynamic nonlinear models

Rolain, Y.; Van Moer, W.; Schoukens, J. (2003)

Measuring in-band distortions of mixers

Geens, A.; Van Moer, W.; Rolain, Y. (2003)

Measuring mixed signal substrate coupling

Rolain, Yves; Van Moer, W.; Vandersteen, Gerd; Van Heijningen, Marc (2000)

Measuring mixed-signal substrate coupling

Rolain, Y.; Van Moer, W.; Vandersteen, Gerd; Van Heijningen, Marc (2001)

Measuring nonlinear differential RF amplifiers using one single-ended source

Rolain, Y.; Van Moer, W.; Schoukens, J.; Pintelon, R. (2007)

Measuring nonlinear differential RF amplifiers using one single-ended source

Rolain, Y.; Van Moer, W.; Schoukens, J.; Pintelon, R. (2003)

Measuring the sensitivity of microwave components to bias vibrations

Van Moer, W.; Rolain, Y. (2004)