Browsing by author "Mouthaan, T."
Now showing items 1-4 of 4
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Early resistance change modelling in electromigration
Mouthaan, T.; Petrescu, Violeta; Schoenmaker, Wim; Groot, F.; Angelecu, S.; Niehof, J.; Profirescu, M. D. (1995) -
Mechanical stress evolution and the Blech length: 2D simulation of early electromigration effects
Petrescu, Violeta; Mouthaan, T.; Schoenmaker, Wim; Salm, C. (1998) -
Mechanical stress evolution and the Blech length: 2D simulation of early electromigration effects
Petrescu, Violeta; Mouthaan, T.; Schoenmaker, Wim; Salm, C. (1998) -
Numerical analysis of electromigration in thin film VLSI interconnections
Petrescu, Violeta; Mouthaan, T.; Schoenmaker, Wim; Angelescu, Serban; Vissarion, R.; Dima, G.; Wallinga, H.; Profirescu, M. D. (1995)