Browsing by author "Diehle, Patrick"

Now showing items 1-2 of 2

Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization

Mukherjee, Kalparupa; De Santi, Carlo; Borga, Matteo; Geens, Karen; You, Shuzhen; Bakeroot, Benoit; Decoutere, Stefaan; Diehle, Patrick; Huebner, Susanne; Altmann, Frank; Buffolo, Matteo; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo (2021)
Root cause analysis of gate shorts in semi-vertical GaN MOSFET devices

Diehle, Patrick; Hübner, Susanne; De Santi, Carlo; Mukherjee, Kalparupa; Zanoni, Enrico; Meneghini, Matteo; Geens, Karen; You, Shuzhen; Decoutere, Stefaan; Altmann, Frank (2021)