Publication:

Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization

Date

2021
Journal Article Review
https://doi.org/10.3390/ma14092316
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Published version 18.92 MB

Author(s)

Mukherjee, Kalparupa
;
De Santi, Carlo
;
Borga, Matteo  
;
Geens, Karen  
;
You, Shuzhen  
;
Bakeroot, Benoit
;
Decoutere, Stefaan  
;
Diehle, Patrick
;
Huebner, Susanne
;
Altmann, Frank
;
Buffolo, Matteo
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico
;
Meneghini, Matteo

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