Publication:
Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization
Loading...
Journal
Abstract
Description
Metrics
Downloads
491 since deposited on 2022-03-04
Acq. date: 2025-10-23
Views
2026 since deposited on 2022-03-04
Acq. date: 2025-10-23
Citations
Metrics
Downloads
491 since deposited on 2022-03-04
Acq. date: 2025-10-23
Views
2026 since deposited on 2022-03-04
Acq. date: 2025-10-23
Citations