Publication:
Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization
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526 since deposited on 2022-03-04
25last month
7last week
Acq. date: 2025-12-11
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2029 since deposited on 2022-03-04
2last month
2last week
Acq. date: 2025-12-11
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