Root cause analysis of gate shorts in semi-vertical GaN MOSFET devices

Thumbnail
Metadata
Show full item record
Authors
Diehle, Patrick; Hübner, Susanne; De Santi, Carlo; Mukherjee, Kalparupa; Zanoni, Enrico; Meneghini, Matteo; Geens, Karen; You, Shuzhen; Decoutere, Stefaan; Altmann, Frank
Conference
International Conference on Advanced Semi-conductor Devices And Microsystems
Title
Root cause analysis of gate shorts in semi-vertical GaN MOSFET devices
Publication type
Proceedings paper
Collections