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Root cause analysis of gate shorts in semi-vertical GaN MOSFET devices
Publication:
Root cause analysis of gate shorts in semi-vertical GaN MOSFET devices
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Date
2021
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Diehle, Patrick
;
Hübner, Susanne
;
De Santi, Carlo
;
Mukherjee, Kalparupa
;
Zanoni, Enrico
;
Meneghini, Matteo
;
Geens, Karen
;
You, Shuzhen
;
Decoutere, Stefaan
;
Altmann, Frank
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1996
since deposited on 2021-10-31
1
last month
Acq. date: 2025-12-12
Citations
Metrics
Views
1996
since deposited on 2021-10-31
1
last month
Acq. date: 2025-12-12
Citations