Browsing by author "Fazan, P."
Now showing items 1-4 of 4
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Constant-current study of dielectric breakdown of Pb(Zr,Ti)O-3 ferroelectric film capacitors
Stolichnov, Igor; Tagantsev, A.; Setter, N.; Okhonin, S.; Fazan, P.; Cross, J. S.; Tsukada, M.; Bartic, Andrei; Wouters, Dirk (2001) -
FinFETs with Thermally Stable RMG Gate Stack for Future DRAM Peripheral Circuits
Capogreco, Elena; Arimura, Hiroaki; Ritzenthaler, Romain; Brus, Stephan; Oniki, Yusuke; Dupuy, Emmanuel; Sebaai, Farid; Radisic, Dunja; Chan, BT; Zhou, Daisy; Machkaoutsan, V.; Yoon, S.; Itokawa, H.; Yamaguchi, M.; Gao, Z.; Fazan, P.; Chen, Y.; Subramanian, Sujith; Ragnarsson, Lars-Ake; Spessot, Alessio; Dentoni Litta, Eugenio (2022) -
Impact of channel engineering technology on HC performance of 100 nm MOSFETs
Okhonin, S.; Fazan, P.; Kubicek, Stefan; Henson, Kirklen; De Meyer, Kristin; Ponomarev, Youri (2001) -
Transient effects in PD SOI MOSFETs and potential DRAM applications
Okhonin, S.; Nagoga, M.; Sallese, J.-M.; Fazan, P.; Faynot, J.; Pontcharra, J.; Cristoloveanu, S.; van Meer, Hans; De Meyer, Kristin (2002)