Browsing by author "Hollinger, Guy"
Now showing items 1-5 of 5
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High oxidation state at the epitaxial interface of g-Al2O3 thin films grown on Si(111) and Si(001)
El-Kazzi, Mario; Merckling, Clement; Saint-Girons, Guillaume; Grenet, Genevieve; Silly, M.; Sirotti, F.; Hollinger, Guy (2010) -
Molecular beam epitaxial growth of BaTiO3 single crystal on Ge-on-Si(001) substrate
Merckling, Clement; Saint-Girons, Guillaume; Botella, Claude; Hollinger, Guy; Heyns, Marc; Dekoster, Johan; Caymax, Matty (2011) -
Strategies for CMOS low equivalent oxide thickness achievement with high-k oxides grown on Si(001) by MBE
Beccera, Loic; Baboux, Nicolas; Plossu, Carole; Merckling, Clement; El-Kazzi, Mario; Saint-Girons, Guillaume; Vilquin, Bertrand; Hollinger, Guy (2008) -
Synchrotron radiation and conventional X-ray source photoemission studies of epitaxial g-Al2O3 thin films grown on Si(111) & Si(001) substrates by molecular beam epitaxy
El-Kazzi, Mario; Merckling, Clement; Grenet, Genevieve; Saint-Girons, Guillaume; Sirotti, Fausto; Hollinger, Guy (2009) -
X-ray photoelectron diffraction study of thin Al2O3 films grown on Si(111) by molecular beam epitaxy
El-Kazzi, Mario; Grenet, Genevieve; Merckling, Clement; Saint-Girons, Guillaume; Botella, Claude; Marty, Olivier; Hollinger, Guy (2009)