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X-ray photoelectron diffraction study of thin Al2O3 films grown on Si(111) by molecular beam epitaxy
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Authors
El-Kazzi, Mario
;
Grenet, Genevieve
;
Merckling, Clement
;
Saint-Girons, Guillaume
;
Botella, Claude
;
Marty, Olivier
;
Hollinger, Guy
ISSN
1098-0121
Issue
19
Journal
Physical Review B
Volume
79
Title
X-ray photoelectron diffraction study of thin Al2O3 films grown on Si(111) by molecular beam epitaxy
Publication type
Journal article
Embargo date
9999-12-31
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