Publication:
X-ray photoelectron diffraction study of thin Al2O3 films grown on Si(111) by molecular beam epitaxy
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2052 since deposited on 2021-10-17
1last month
Acq. date: 2025-12-15
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2052 since deposited on 2021-10-17
1last month
Acq. date: 2025-12-15
Citations