Browsing by author "Chang, S.Z."

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Achieving Low-VT Ni-FUSI CMOS by ultra-thin Dy2O3 capping of hafnium silicate dielectrics

Veloso, Anabela; Yu, HongYu; Chang, S.Z.; Adelmann, Chris; Onsia, Bart; Brus, Stephan (2007)
High-k/ metal-gate stack work-function tuning by rare-earth capping layers: interface dipole or bulk charge?

Yu, H.Y; Chang, S.Z.; Aoulaiche, Marc; Kaczer, Ben; Absil, Philippe; Adelmann, Christoph; Hoffmann, Thomas Y.; Biesemans, Serge; Wann, C; Mii, Y.J (2009)