Browsing by author "Al-Kofahi, I. S."
Now showing items 1-5 of 5
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Behavior of hot hole stressed SiO2/Si interface at elevated temperatures
Zhang, Jenny; Al-Kofahi, I. S.; Groeseneken, Guido (1998) -
Continuing degradation of the SiO2/Si interface after hot hole stress
Al-Kofahi, I. S.; Zhang, Jenny; Groeseneken, Guido (1997) -
Generation and annealing of hot hole induced interface states
Al-Kofahi, I. S.; Zhang, Jenny; Groeseneken, Guido (1997) -
On the hot-hole induced post-stress interface trap generation in MOSFETs
Al-Kofahi, I. S.; Zhang, Jenny; Groeseneken, Guido (1996) -
The enhanced degradation of MOSFETs damaged by hot holes
Al-Kofahi, I. S.; Zhang, Jenny; Groeseneken, Guido (1996)