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Behavior of hot hole stressed SiO2/Si interface at elevated temperatures
Publication:
Behavior of hot hole stressed SiO2/Si interface at elevated temperatures
Date
1998
Journal article
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2528.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Jenny
;
Al-Kofahi, I. S.
;
Groeseneken, Guido
Journal
Journal of Applied Physics
Abstract
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1890
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Citations
Metrics
Views
1890
since deposited on 2021-10-01
402
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations