Continuing degradation of the SiO2/Si interface after hot hole stress

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Authors

Al-Kofahi, I. S.; Zhang, Jenny; Groeseneken, Guido

Issue

6

Journal

Journal of Applied Physics

Volume

81

Title

Continuing degradation of the SiO2/Si interface after hot hole stress

Publication type

Journal article

Embargo date

9999-12-31

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