Browsing by author "Lobato, I."
Now showing items 1-2 of 2
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Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection
Fatermans, J.; den Dekker, Arnold Jan; Müller-Caspary, K.; Lobato, I.; Van Aert, S. (2018) -
The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images
Fatermans, J.; den dekker, Arnold Jan; Müller-Caspary, K.; Lobato, I.; Van Aert, Sandra (2018)