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Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection
Publication:
Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fatermans, J.
;
den Dekker, Arnold Jan
;
Müller-Caspary, K.
;
Lobato, I.
;
Van Aert, S.
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1930
since deposited on 2021-10-25
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Acq. date: 2025-12-09
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Metrics
Views
1930
since deposited on 2021-10-25
1
last month
Acq. date: 2025-12-09
Citations