Browsing by author "Coppens, P."
Now showing items 1-7 of 7
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A 0.35μm SiGe BiCMOS process featuring a 80 GHz Fmax HBT and integrated high-Q RF passive components
Decoutere, Stefaan; Vleugels, Frank; Kuhn, Rudiger; Loo, Roger; Caymax, Matty; Jenei, Snezana; Croon, Jeroen; Van Huylenbroeck, Stefaan; Da Rold, Martina; Rosseel, Erik; Chevalier, P.; Coppens, P. (2000) -
Antenna test structure matrix description, application for optimized HDP oxide deposition, metal etch, Ar preclean and passivation processing in sub-half micron CMOS processing
Ackaert, J.; de Backer, E.; Coppens, P.; Creusen, Martin (1999) -
Breakdown and hot carrier injection in deep trench isolation structures
Elattari, Brahim; Coppens, P.; Van den Bosch, Geert; Moens, P.; Groeseneken, Guido (2005) -
Correlation between predicted cause of SRAM failures and in-line defect data
Coppens, P.; Vanhorebeek, Guido; De Backer, E. (2001) -
Impact of charging on breakdown in deep trench isolation structures
Elattari, Brahim; Van den Bosch, Geert; Schoenmaker, Wim; Groeseneken, Guido; Coppens, P.; Moens, P.; De Pestel, F. (2003) -
Innovating SRAM design and test program for fast process related defect recognition and failure analysis
Coppens, P.; Vanhorebeek, Guido; De Backer, E.; Yuan, Xiao Jie (1999) -
Innovating SRAM design for fast process related defect recognition and failure analysis
Coppens, P.; Vanhorebeek, Guido; De Backer, E.; Yuan, Xiao Jie (1999)