Browsing by author "Yan, L."

Now showing items 1-3 of 3

1/f noise study on strained Si0.8Ge0.2 p-channel MOSFETs with high-k/poly Si gate stack

Yan, L.; Simoen, Eddy; Olsen, S.H.; Akheyar, Amal; Claeys, Cor; O'Neill, A.G. (2009)
Strained Si/SiGe MOS technology

Olsen, S.; Yan, L.; Agaiby, R.; Escobedo-Cousin, E.; O'Neill, A.G.; Hellstrom, P.-E.; Ostling, M.; Lyutovich, L.; Kasper, E.; Claeys, Cor; Parker, E.H.C. (2007)
Strained Si/SiGe MOS technology: improving gate dielectric integrity

Olsen, S.H.; Yan, L.; Agaiby, R.; Escobedo-Cousin, A.G.; O'Neil, A.G.; Hellstrom, P.E.; Ostling, M.; Lyutovich, K.; Kasper, E.; Claeys, Cor; Parker, E.H.C. (2009)