1/f noise study on strained Si0.8Ge0.2 p-channel MOSFETs with high-k/poly Si gate stack

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Authors

Yan, L.; Simoen, Eddy; Olsen, S.H.; Akheyar, Amal; Claeys, Cor; O'Neill, A.G.

ISSN

0038-1101

Issue

11

Journal

Solid-State Electronics

Volume

53

Title

1/f noise study on strained Si0.8Ge0.2 p-channel MOSFETs with high-k/poly Si gate stack

Publication type

Journal article

Embargo date

9999-12-31

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