Browsing by author "Tielemans, Luc"
Now showing items 1-3 of 3
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Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics
De Schepper, Luc; De Ceuninck, Ward; Lekens, Geert; Stals, Lambert; Vanhecke, Bruno; Roggen, Jean; Beyne, Eric; Tielemans, Luc (1994) -
DESTIN: A new approach to interconnect reliability testing
Witvrouw, Ann; Beyer, Gerald; Maex, Karen; Tielemans, Luc (1998) -
The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric technique
Van Olmen, Jan; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; D'Haeger, V.; Witvrouw, Ann; Maex, Karen; Vandevelde, Bart; Beyne, Eric; Tielemans, Luc (1999)