Authors

Van Olmen, Jan; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; D'Haeger, V.; Witvrouw, Ann; Maex, Karen; Vandevelde, Bart; Beyne, Eric; Tielemans, Luc

Issue

11

Journal

Microelectronics and Reliability

Volume

39

Title

The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric technique

Publication type

Journal article