Browsing by author "De Schepper, Luc"
Now showing items 1-20 of 54
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A comparison between state-of-the-art `gilch' and `sulphinyl' synthesised MDMO-PPV/PCBM bulk hetero-junction solar cells
Munters, T.; Martens, T.; Goris, Ludwig; Vrindts, Veerle; Manca, Jean; Lutsen, Laurence; De Ceuninck, Ward; Vanderzande, Dirk; De Schepper, Luc; Gelan, J.; Sariciftci, N.S.; Brabec, C.J. (2002) -
A high resolution method for measuring hot carrier degradation in matched transistor pairs
Dreesen, R.; De Ceuninck, Ward; De Schepper, Luc; Groeseneken, Guido (1997) -
A high resolution method for measuring hot carrier degradation in matched transistor pairs
Dreesen, R.; De Ceuninck, Ward; De Schepper, Luc; Groeseneken, Guido (1997) -
A new degradation model and lifetime extrapolation technique for lightly doped drain NMOSFETs under hot-carrier degradation
Dreesen, R.; Croes, Kris; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; Pergoot, A.; Groeseneken, Guido (2001) -
A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation
Dreesen, R.; Croes, Kris; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; Pergoot, A.; Groeseneken, Guido (1999) -
A new method for the analysis of high-resolution SILC data
Aresu, Stefano; De Ceuninck, Ward; Knuyt, G.; Mertens, Jan; Manca, Jean; De Schepper, Luc; Degraeve, Robin; Kaczer, Ben; D'Olieslaeger, Marc; D'Haen, Jan (2003) -
Absorption phenomena in organic thin films for solar cell applications by photothermal deflection spectroscopy
Goris, Ludwig; Haenen, Ken; Nesladek, Milos; Wagner, P.; Vanderzande, Dirk; De Schepper, Luc; D'Haen, Jan; Lutsen, Laurence; Manca, Jean (2004) -
Absorption phenomena in organic thin films for solar cell applications investigated by photothermal deflection spectroscopy
Goris, Ludwig; Haenen, Ken; Nesladek, Milos; Wagner, P.; Vanderzande, Dirk; De Schepper, Luc; D'Haen, Jan; Lutsen, Laurence; Manca, Jean (2005) -
Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics
De Schepper, Luc; De Ceuninck, Ward; Lekens, Geert; Stals, Lambert; Vanhecke, Bruno; Roggen, Jean; Beyne, Eric; Tielemans, Luc (1994) -
Analytical bounds for the MLE of the Weibull shape parameter
Andries, E.; Croes, K.; De Ceuninck, Ward; De Schepper, Luc; Molenberghs, G. (2002) -
Application of general finite mixture models to reliability data using likelihood estimation
Andries, E.; Croes, K.; De Schepper, Luc; Molenberghs, G. (2003) -
Characterisation of homoepitaxial and polycrystalline CVD diamond pn-junctions
Haenen, Ken; Mortet, V.; D'Haen, Jan; Williams, O.A.; Nesladek, Milos; De Schepper, Luc; Koizumi, S. (2005) -
Disclosure of the nanostructure of MDMO-PPV: PCBM bulk hetero-junction organic solar cells by a combination of SPM and TEM
Martens, T.; D'Haen, Jan; Munters, T.; Beelen, Z.; Goris, Ludwig; Manca, Jean; D'Olieslaeger, Marc; Vanderzande, Dirk; De Schepper, Luc; Andriessen, R. (2003) -
Disclosure of the nanostructure of MDMO-PPV:PCBM bulk hetero-junction organic solar cells by a combination of SMP and TEM
Martens, T.; Beelen, Z.; Munters, T.; Vanderzande, D.; De Schepper, Luc; D'Haen, Jan; Goris, Ludwig; Manca, Jean; D'Olieslaeger, Marc; Andriessen, R. (2002) -
Dynamics of electromigration induced void-hillock growth and precipitation/dissolution of addition elements studied by in-situ electron microscopy resistance measurements
D'Haen, Jan; Cosemans, P.; Manca, Jean; Lekens, Geert; Martens, T.; De Ceuninck, Ward; D'Olieslaeger, Marc; De Schepper, Luc; Maex, Karen (1999) -
Electrical characterisation and reliability studies of thick film gas sensor structures
Czech, Ingrid; Manca, Jean; Roggen, Jean; Huyberechts, Guido; Stals, Lambert; De Schepper, Luc (1996) -
Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopy
Bijnens, W.; De Wolf, Ingrid; Manca, Jean; D'Haen, Jan; Wu, Ting-Di; D'Olieslaeger, Marc; Beyne, Eric; Kiebooms, R.; Vanderzande, Dirk; Gelan, J.; De Ceuninck, Ward; De Schepper, Luc; Stals, Lambert (1998) -
Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology
Petersen, R.; De Ceuninck, Ward; D'Haen, Jan; D'Olieslaeger, Marc; De Schepper, Luc; Vendier, O.; Blanck, H.; Pons, D. (2002) -
High-resolution SILC measurements of thin SiO2 at ultra low voltages
Aresu, S.; De Ceuninck, Ward; Dreesen, R.; Kroes, K.; Andries, E.; Manca, Jean; De Schepper, Luc; Degraeve, Robin; Kaczer, Ben; D'Olieslaeger, Marc; D'Haen, Jan (2002) -
Homoepitaxial and polycrystalline CVD diamnond pn-junctions
Haenen, Ken; Mortet, V.; D'Haen, Jan; Williams, O.A.; Nesladek, Milos; De Schepper, Luc; Koizumi, S. (2005)