A new method for the analysis of high-resolution SILC data

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Author(s)

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De Ceuninck, Ward

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De Schepper, Luc

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Degraeve, Robin

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D'Olieslaeger, Marc

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Journal

Microelectronics Reliability

Metrics

1974 since deposited on 2021-10-15

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Acq. date: 2025-12-08