Browsing by author "D'Haeger, V."
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Overview of the kinetics of the early stages of electromigration under low (=realistic) current density stress
Van Olmen, Jan; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; D'Haeger, V.; Witvrouw, Ann; Maex, Karen (1998) -
Overview of the kinetics of the early stages of electromigration under low (=realistic) current density stress
Van Olmen, Jan; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; D'Haeger, V.; Witvrouw, Ann; Maex, Karen (1998) -
The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal lines
De Ceuninck, Ward; D'Haeger, V.; Van Olmen, Jan; Witvrouw, Ann; Maex, Karen; De Schepper, Luc; De Pauw, P.; Pergoot, A. (1998) -
The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric technique
Van Olmen, Jan; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; D'Haeger, V.; Witvrouw, Ann; Maex, Karen; Vandevelde, Bart; Beyne, Eric; Tielemans, Luc (1999)