Authors

Van Olmen, Jan; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; D'Haeger, V.; Witvrouw, Ann; Maex, Karen

Issue

6_8

Journal

Microelectronics Reliability

Volume

38

Title

Overview of the kinetics of the early stages of electromigration under low (=realistic) current density stress

Publication type

Journal article

Embargo date

9999-12-31