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Overview of the kinetics of the early stages of electromigration under low (=realistic) current density stress
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Overview of the kinetics of the early stages of electromigration under low (=realistic) current density stress
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Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Olmen, Jan
;
Manca, Jean
;
De Ceuninck, Ward
;
De Schepper, Luc
;
D'Haeger, V.
;
Witvrouw, Ann
;
Maex, Karen
Journal
Microelectronics Reliability
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1989
since deposited on 2021-10-01
4
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1989
since deposited on 2021-10-01
4
last month
Acq. date: 2025-12-15
Citations