Browsing by author "Jin, S."
Now showing items 21-40 of 49
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Interaction between Co and SiO2
Kondoh, Eiichi; Donaton, R. A.; Jin, S.; Bender, Hugo; Vandervorst, Wilfried; Maex, Karen (1998) -
Investigation on the corrosion of Cu metallization in the focused ion beam system due to a low I2 background
Bender, Hugo; Jin, S.; Vervoort, Iwan; Lantasov, Yuri (1999) -
Ion beam syntheses and microstructure studies of a new FeSi2 phase
Jin, S.; Li, Xiuqiong; Zhang, Zheng; Dong, C.; Gong, Z. X.; Bender, Hugo; Ma, T. C. (1996) -
Ion beam synthesis of Ni-Fe-Si layer by TEM
Li, X. N.; Dong, C.; Jin, S.; Ma, T. C.; Zhang, Q. Y. (1998) -
Ion beam synthesis of TiSi2 in (100)Si and (111)Si
Jin, S.; Chen, L. J. (1998) -
Irradiation effects of silicon dioxide films implanted by carbon ions
Yu, Y. H.; Zhao, J.; Jin, S. (2000) -
Low-thermal-budget treatments of porous silicon surface layers on crystalline Si solar cells: A way to go for improved surface passivation?
Stalmans, Lieven; Poortmans, Jef; Bender, Hugo; Conard, Thierry; Jin, S.; Nijs, Johan; Mertens, Robert; Strehlke, S.; Lévy-Clément, C.; Debarge, L.; Slaoui, A. (1999) -
Micro-characterisation of Pt silicides prepared on (100) silicon
Jin, S.; Bender, Hugo; Alves Donaton, Ricardo; Maex, Karen (1997) -
Microstructural studies by transmission electron microscopy of the formation of ultrathin PtSi layers with novel silicidation processes
Jin, S.; Bender, Hugo; Alves Donaton, Ricardo; Maex, Karen (1999) -
Microstructural studies of Co silicide layers formed on SiGe and SiGeC
Jin, S.; Bender, Hugo; Donaton, R. A.; Maex, Karen; Vantomme, Andre; Langouche, G.; St. Amour, A.; Sturm, J. C. (1997) -
Microstructural studies of Co silicide layers formed on SiGe and SiGeC
Jin, S.; Bender, Hugo; Donaton, R. A.; Maex, Karen; Vantomme, Andre; Langouche, G.; St. Amour, A.; Sturm, J. C. (1997) -
Microstructural studies of Fe-silicide films produced by metal vapor vacuum arc ion implantation of Fe into Si substrates
Jin, S.; Bender, Hugo; Li, X. N.; Zhang, Zheng; Dong, C.; Gong, Z. X.; Ma, T. C. (1997) -
Microstructure of titanium oxide films investigated by atomic force microscopy and transmission electron microscopy
Zhang, Feng; Liu, X.; Jin, S.; Bender, Hugo; Lou, N. Z.; Wilson, Z. H. (1998) -
Morphological properties of porous-Si layers for n+-emitter applications
Bender, Hugo; Jin, S.; Poortmans, Jef; Stalmans, Lieven (1999) -
New approaches for formation of ultra-thin PtSi layers for infrared applications
Alves Donaton, Ricardo; Jin, S.; Bender, Hugo; Zagrebnov, Maxim; Baert, Kris; Maex, Karen; Vantomme, Andre; Langouche, G. (1998) -
New approaches for formation of ultra-thin PtSi layers for infrared applications
Alves Donaton, Ricardo; Jin, S.; Bender, Hugo; Zagrebnov, Maxim; Baert, Kris; Maex, Karen; Vantomme, Andre; Langouche, G. (1998) -
New technique for forming continuous, smooth and uniform ultrathin (3nm) PtSi layers
Alves Donaton, Ricardo; Jin, S.; Bender, Hugo; Conard, Thierry; De Wolf, Ingrid; Maex, Karen; Vantomme, Andre; Langouche, G. (1999) -
Quantitative determination of the dielectric constant of the interfacial layer in PZT ferroelectric capacitors
Bartic, Andrei; Wouters, Dirk; Jin, S.; Norga, Gerd; Bender, Hugo; Maes, Herman (1998) -
Stabilisation and phase transformation of hexagonal rare-earth silicides on Si(111)
Vantomme, Andre; Wu, Ming Fang; Hogg, S.; Wahl, U.; Deweerd, Wim; Pattyn, Hugo; Langouche, G.; Jin, S.; Bender, Hugo (1998) -
Stabilisation and phase transformation of hexagonal rare-earth silicides on Si(111)
Vantomme, Andre; Wu, Ming Fang; Hogg, S. M.; Wahl, U.; Deweerd, Wim; Pattyn, Hugo; Langouche, G.; Jin, S.; Bender, Hugo (1999)