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Microstructural studies by transmission electron microscopy of the formation of ultrathin PtSi layers with novel silicidation processes
Publication:
Microstructural studies by transmission electron microscopy of the formation of ultrathin PtSi layers with novel silicidation processes
Date
1999
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jin, S.
;
Bender, Hugo
;
Alves Donaton, Ricardo
;
Maex, Karen
Journal
Journal of Materials Research
Abstract
Description
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Views
1950
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations
Metrics
Views
1950
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations