Browsing by author "Hurd, Trace"
Now showing items 21-25 of 25
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The impact of Fe and Cu on the minority carrier lifetime of P and N-type silicon wafers
Rotondaro, Antonio; Hurd, Trace; Kaniava, Arvydas; Vanhellemont, Jan; Simoen, Eddy; Heyns, Marc; Claeys, Cor; Brown, G. (1995) -
The importance of H2O2 decomposition in silicon surface cleaning
Schmidt, Harald; Meuris, Marc; Mertens, Paul; Rotondaro, Antonio; Heyns, Marc; Hurd, Trace; Hatcher, Z. (1994) -
The role of hydrogen peroxide in the SC2 clean
Hurd, Trace; Mertens, Paul; Schmidt, Harald; Ditter, D.; Hall, L. H.; Meuris, Marc; Heyns, Marc (1994) -
Ultra clean processing technologies: advanced si-surface preparation techniques
Heyns, Marc; Meuris, Marc; Mertens, Paul; Hurd, Trace; Schmidt, Harald; Verhaverbeke, Steven; Hatcher, Z.; Gräf, D. (1994) -
Ultra Clean Processing Technologies: Advanced Si-Surface Preparation Techniques
Heyns, Marc; Meuris, Marc; Mertens, Paul; Hurd, Trace; Schmidt, Harald; Verhaverbeke, Steven; Hatcher, Z.; Gräf, D. (1994)