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The impact of Fe and Cu on the minority carrier lifetime of P and N-type silicon wafers
Publication:
The impact of Fe and Cu on the minority carrier lifetime of P and N-type silicon wafers
Date
1995
Proceedings Paper
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815.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rotondaro, Antonio
;
Hurd, Trace
;
Kaniava, Arvydas
;
Vanhellemont, Jan
;
Simoen, Eddy
;
Heyns, Marc
;
Claeys, Cor
;
Brown, G.
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1941
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1941
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations