Authors

Rotondaro, Antonio; Hurd, Trace; Kaniava, Arvydas; Vanhellemont, Jan; Simoen, Eddy; Heyns, Marc; Claeys, Cor; Brown, G.

Conference

ALTECH 95: Analytical Techniques for Semiconductor Materials and Process Characterization II. Proceedings of the Satellite Sympo

Title

The impact of Fe and Cu on the minority carrier lifetime of P and N-type silicon wafers

Publication type

Proceedings paper

Embargo date

9999-12-31