Browsing by author "Paredis, Kristof"
Now showing items 21-40 of 58
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Effects of buried grain boundaries in multilayer MoS2
Ludwig, Jonathan; Nalin Mehta, Ankit; Mascaro, Marco; Celano, Umberto; Chiappe, Daniele; Bender, Hugo; Vandervorst, Wilfried; Paredis, Kristof (2019) -
Effects of grain boundaries on the electronic properties of MoS2 layers
Ludwig, Jonathan; Chiappe, Daniele; Mascaro, Marco; Celano, Umberto; Asselberghs, Inge; Radu, Iuliana; van der Heide, Paul; Vandervorst, Wilfried; Paredis, Kristof (2018) -
Electrical atomic force microscopy for 2D transition metal dichalcogenide materials
Celano, Umberto; Virkki, Olli; Mascaro, Marco; Nalin Mehta, Ankit; Bender, Hugo; Chiappe, Daniele; Asselberghs, Inge; Paredis, Kristof; Hoflijk, Ilse; Franquet, Alexis; Huyghebaert, Cedric; Radu, Iuliana; Vandervorst, Wilfried (2017) -
Electrical properties of extended defects in strain relaxed GeSn
Gupta, Somya; Simoen, Eddy; Loo, Roger; Shimura, Yosuke; Gencarelli, Federica; Wouters, Lennaert; Paredis, Kristof; Bender, Hugo; Vrielink, Henk; Heyns, Marc (2018) -
Experimental and theoretical study of Ge surface passivation
Houssa, Michel; Pourtois, Geoffrey; Kaczer, Ben; De Jaeger, Brice; Leys, Frederik; Nelis, Daniel; Paredis, Kristof; Vantomme, Andre; Caymax, Matty; Meuris, Marc; Heyns, Marc (2007) -
Exploring the impact of confinement in Spreading Resistance Microscopy Analysis
Pandey, Komal; Paredis, Kristof; Vandervorst, Wilfried (2017) -
Fabrication of magnetic tunnel junctions connected through a continuous free layer to enable spin logic devices
Wan, Danny; Manfrini, Mauricio; Vaysset, Adrien; Souriau, Laurent; Wouters, Lennaert; Thiam, Arame; Raymenants, Eline; Sayan, Safak; Jussot, Julien; Swerts, Johan; Couet, Sebastien; Rassoul, Nouredine; Babaei Gavan, Khashayar; Paredis, Kristof; Huyghebaert, Cedric; Ercken, Monique; Wilson, Chris; Mocuta, Dan; Radu, Iuliana (2018) -
Ferroelectricity in Si-doped hafnia: probing challenges in absence of screening charges
Celano, Umberto; Gomez, Andres; Piedimonte, Paola; Neumayer, Sabine; Collins, Liam; Popovici, Mihaela Ioana; Florent, Karine; McMitchell, Sean; Favia, Paola; Drijbooms, Chris; Bender, Hugo; Paredis, Kristof; Di Piazza, Luca; Jesse, Stephen; Van Houdt, Jan; van der Heide, Paul (2020) -
Hedgehog probe tips enabling high-resolution scanning probe microscopy
Boehme, Thijs; Hantschel, Thomas; Wouters, Lennaert; Folkersma, Steven; Paredis, Kristof; Vandervorst, Wilfried (2019) -
Imaging confined and bulk p-type/n-type carriers in (Al,Ga)N heterostructures with multiple quantum wells
Minj, Albert; Zhao, Ming; Bakeroot, Benoit; Paredis, Kristof (2021) -
Improved atom probe reconstruction through tp shape constraints supplied by scanning probe microscopy
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; van der Heide, Paul; Vandervorst, Wilfried; Geiser, Brian; Bunton, Joe; Ulfig, Robert; Larson, Dave (2020) -
Improving APT-AFM technology: towards high resolution 3D APT tip shapes
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; Vandervorst, Wilfried (2018) -
Individual device analysis using hybrid TEM-scalpel SSRM metrology
Celano, Umberto; Favia, Paola; Drijbooms, Chris; Dixon-Luinenburg, Oberon; Richard, Olivier; Bender, Hugo; Vancoille, Eric; Paredis, Kristof; Loo, Roger; Schulze, Andreas; Hikavyy, Andriy; Witters, Liesbeth; Mitard, Jerome; Collaert, Nadine; Horiguchi, Naoto; Vandervorst, Wilfried (2017) -
Integration of interconnected magnetic tunnel junctions for spin torque majority gates
Wan, Danny; Manfrini, Mauricio; Souriau, Laurent; Sayan, Safak; Jussot, Julien; Swerts, Johan; Rassoul, Nouredine; Babaei Gavan, Khashayar; Wouters, Lennaert; Paredis, Kristof; Huyghebaert, Cedric; Vaysset, Adrien; Thiam, Arame; Ercken, Monique; Wilson, Chris; Mocuta, Dan; Radu, Iuliana (2017) -
Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformity
Chiappe, Daniele; Ludwig, Jonathan; Leonhardt, Alessandra; El Kazzi, Salim; Nalin Mehta, Ankit; Nuytten, Thomas; Celano, Umberto; Sutar, Surajit; Pourtois, Geoffrey; Caymax, Matty; Paredis, Kristof; Vandervorst, Wilfried; Lin, Dennis; De Gendt, Stefan; Barla, Kathy; Huyghebaert, Cedric; Asselberghs, Inge; Radu, Iuliana (2018) -
Mapping conductance and carrier distributions in confined three-dimensional transistor structures
Schulze, Andreas; Eyben, Pierre; Mody, Jay; Paredis, Kristof; Wouters, Lennaert; Celano, Umberto; Vandervorst, Wilfried (2019) -
Mechanisms of high-pressure tip-induced material removal toward a tomographic AFM
Celano, Umberto; Pandey, Komal; Wouters, Lennaert; Paredis, Kristof; van der Heide, Paul; Vandervorst, Wilfried (2018) -
Mesoscopic physical removal of material using sliding nano-diamond contacts
Celano, Umberto; Hsia, Feng Chun; Vanhaeren, Danielle; Paredis, Kristof; Nordling, Torbjörn; Buijnsters, Josephus; Hantschel, Thomas; Vandervorst, Wilfried (2018) -
Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography
Chintala, Ravi Chandra; Wood, Sebastian; Blakesley, James C.; Favia, Paola; Celano, Umberto; Paredis, Kristof; Vandervorst, Wilfried; Castro, Fernando A. (2019) -
Nanoscale localisation of an atom probe tip through electric field mapping
Op de Beeck, Jonathan; Fleischmann, Claudia; Vandervorst, Wilfried; Paredis, Kristof (2020)