Browsing by author "Verreck, Devin"
Now showing items 21-40 of 75
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Enabling 3D NAND Trench Cells for Scaled Flash Memories
Rachidi, Sana; Ramesh, Siva; Breuil, Laurent; Tao, Zheng; Verreck, Devin; Donadio, Gabriele Luca; Arreghini, Antonio; Van den Bosch, Geert; Rosmeulen, Maarten (2023) -
Extracting the effective bandgap of heterojunctions using Esaki diode I-V meaurements
Smets, Quentin; Verhulst, Anne; El Kazzi, Salim; Verreck, Devin; Richard, Olivier; Bender, Hugo; Collaert, Nadine; Mocuta, Anda; Thean, Aaron; Heyns, Marc (2015) -
Extreme scaling enabled by MX2 transistors: variability challenges (invited)
Smets, Quentin; Arutchelvan, Goutham; Schram, Tom; Verreck, Devin; Groven, Benjamin; Cott, Daire; Ahmed, Zubair; Shi, Yuanyuan; Sutar, Surajit; Nalin Mehta, Ankit; Lin, Dennis; Asselberghs, Inge; Radu, Iuliana (2021) -
Full zone spectral solver for the optimization of line and point tunnel field-effect transistors
Verreck, Devin; Verhulst, Anne; Van de Put, Maarten; Soree, Bart; Magnus, Wim; Mocuta, Anda; Collaert, Nadine; Thean, Aaron; Groeseneken, Guido (2015) -
High-current InP-based triple heterojunction tunnel transistors
Long, Pengyu; Huang, Jun; Povolotskyi, Michael; Verreck, Devin; Klimeck, Gerhard; Rodwell, Mark (2016) -
Impact of device scaling on the electrical properties of MoS2 field-effect transistors
Arutchelvan, Goutham; Smets, Quentin; Verreck, Devin; Ahmed, Zubair; Gaur, Abhinav; Sutar, Surajit; Jussot, Julien; Groven, Benjamin; Heyns, Marc; Lin, Dennis; Asselberghs, Inge; Radu, Iuliana (2021) -
Impact of field-induced quantum confinement on the onset of tunneling field-effect transistors: Experimental verification
Smets, Quentin; Verhulst, Anne; Martens, Koen; Lin, Dennis; El Kazzi, Salim; Verreck, Devin; Simoen, Eddy; Collaert, Nadine; Thean, Aaron; Raskin, Jean-Pierre; Heyns, Marc (2014) -
Impact of gate stack processing on the hysteresis of 300 mm integrated WS2 FETs
Panarella, Luca; Kaczer, Ben; Smets, Quentin; Verreck, Devin; Schram, Tom; Cott, Daire; Lin, Dennis; Tyaginov, Stanislav; Asselberghs, Inge; Lockhart de la Rosa, Cesar Javier; Kar, Gouri Sankar; Afanasiev, Valeri (2023) -
Impact of mechanical stress on 3-D NAND current conduction
Kruv, Anastasiia; Arreghini, Antonio; Verreck, Devin; Gonzalez, Mario; Van den Bosch, Geert; De Wolf, Ingrid; Rosmeulen, Maarten (2020) -
Impact of mechanical stress on electrical performance of 3D NAND
Kruv, Anastasiia; Arreghini, Antonio; Gonzalez, Mario; Verreck, Devin; Van den Bosch, Geert; De Wolf, Ingrid; Furnemont, Arnaud (2019) -
Improved source design for p-type tunnel field-effect transistors: Towards truly complementary logic
Verreck, Devin; Verhulst, Anne; Soree, Bart; Collaert, Nadine; Mocuta, Anda; Thean, Aaron; Groeseneken, Guido (2014) -
Improvement of conduction in 3D NAND memory devices by channel and junction optimization
Arreghini, Antonio; Banerjee, Kaustuv; Verreck, Devin; Vadakupudhu Palayam, Senthil; Rosseel, Erik; Nyns, Laura; Van den Bosch, Geert; Furnemont, Arnaud (2019) -
In0.53Ga0.47As diodes for band-to-band tunneling calibration: design, fabrication and characterization
Smets, Quentin; Verhulst, Anne; Rooyackers, Rita; Merckling, Clement; Lin, Dennis; Simoen, Eddy; Alian, AliReza; Mirco, Cantoro; Pourghaderi, Mohammad Ali; Kao, Frank; Verreck, Devin; Collaert, Nadine; Thean, Aaron; Heyns, Marc (2013) -
InGaAs tunnel diodes for the calibration of semi-classical and quantum-mechanical band-to-band tunneling models
Smets, Quentin; Verreck, Devin; Verhulst, Anne; Rooyackers, Rita; Merckling, Clement; Van de Put, Maarten; Simoen, Eddy; Vandervorst, Wilfried; Collaert, Nadine; Thean, Aaron; Soree, Bart; Groeseneken, Guido; Heyns, Marc (2014) -
InGaAs tunnel FET with sub-nanometer EOT and sub-60 mV/dec sub-threshold swing at room temperature
Alian, AliReza; Mols, Yves; Bordallo, Caio C. M.; Verreck, Devin; Verhulst, Anne; Vandooren, Anne; Rooyackers, Rita; Agopian, P.G.D; Martino, J.A.; Thean, Aaron; Lin, Dennis; Mocuta, Dan; Collaert, Nadine (2016) -
Inherent transmission probability limit between valence-band and conduction band states and calibration of tunnel-FET parasitics
Verhulst, Anne; Verreck, Devin; Vandenberghe, William; Smets, Quentin; Mohammed, Mazharuddin; Bizindavyi, Jasper; Heyns, Marc; Soree, Bart; Collaert, Nadine; Mocuta, Anda (2017) -
Interconnect-device co-optimization for field-effect transistors with two-dimensional materials
Verreck, Devin; Arutchelvan, Goutham; Ciofi, Ivan; Heyns, Marc; Radu, Iuliana (2018) -
Introducing 2D-FETs in Device Scaling Roadmap using DTCO
Ahmed, Zubair; Afzalian, Aryan; Schram, Tom; Jang, Doyoung; Verreck, Devin; Smets, Quentin; Schuddinck, Pieter; Chehab, Bilal; Sutar, Surajit; Arutchelvan, Goutham; Soussou, Assawer; Asselberghs, Inge; Spessot, Alessio; Radu, Iuliana; Parvais, Bertrand; Ryckaert, Julien; Na, Myung Hee (2020) -
Large variation in temperature dependence of band-to-band tunneling current in tunnel devices
Bizindavyi, Jasper; Verhulst, Anne; Verreck, Devin; Soree, Bart; Groeseneken, Guido (2019) -
Liquid Memory and the Future of Data Storage
Rosmeulen, Maarten; Lockhart de la Rosa, Cesar Javier; Willems, Kherim; Fransen, Senne; Shih, Bing-Yang; Verreck, Devin; Kalangi, Vasu; Yasin, Farrukh; Philipsen, Harold; Set, Ying Ting; Ronchi, Nicolo; Van Roy, Wim; Henry, Olivier; Arreghini, Antonio; Van den Bosch, Geert; Furnemont, Arnaud (2022)