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Inherent transmission probability limit between valence-band and conduction band states and calibration of tunnel-FET parasitics
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Authors
Verhulst, Anne
;
Verreck, Devin
;
Vandenberghe, William
;
Smets, Quentin
;
Mohammed, Mazharuddin
;
Bizindavyi, Jasper
;
Heyns, Marc
;
Soree, Bart
;
Collaert, Nadine
;
Mocuta, Anda
Conference
5th Berkeley Symposium on Energy-Effiicient Electronic Systems and Steep Transistors Workshop
Title
Inherent transmission probability limit between valence-band and conduction band states and calibration of tunnel-FET parasitics
Publication type
Proceedings paper
Embargo date
9999-12-31
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