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Inherent transmission probability limit between valence-band and conduction band states and calibration of tunnel-FET parasitics
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Inherent transmission probability limit between valence-band and conduction band states and calibration of tunnel-FET parasitics
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Date
2017
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verhulst, Anne
;
Verreck, Devin
;
Vandenberghe, William
;
Smets, Quentin
;
Mohammed, Mazharuddin
;
Bizindavyi, Jasper
;
Heyns, Marc
;
Soree, Bart
;
Collaert, Nadine
;
Mocuta, Anda
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1899
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-13
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Metrics
Views
1899
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-13
Citations