Publication:

Inherent transmission probability limit between valence-band and conduction band states and calibration of tunnel-FET parasitics

Date

2017
Proceedings Paper
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dc.contributor.authorVerhulst, Anne
dc.contributor.authorVerreck, Devin
dc.contributor.authorVandenberghe, William
dc.contributor.authorSmets, Quentin
dc.contributor.authorMohammed, Mazharuddin
dc.contributor.authorBizindavyi, Jasper
dc.contributor.authorHeyns, Marc
dc.contributor.authorSoree, Bart
dc.contributor.authorCollaert, Nadine
dc.contributor.authorMocuta, Anda
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorBizindavyi, Jasper
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorSoree, Bart
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecBizindavyi, Jasper::0000-0002-2213-9017
dc.contributor.orcidimecSoree, Bart::0000-0002-4157-1956
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-24T17:51:56Z
dc.date.available2021-10-24T17:51:56Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29840
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8246193
dc.source.beginpage1
dc.source.conference5th Berkeley Symposium on Energy-Effiicient Electronic Systems and Steep Transistors Workshop
dc.source.conferencedate19/10/2017
dc.source.conferencelocationBerkeley, CA USA
dc.source.endpage3
dc.title

Inherent transmission probability limit between valence-band and conduction band states and calibration of tunnel-FET parasitics

dc.typeProceedings paper
dspace.entity.typePublication
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