Browsing by author "Rao, Siddharth"
Now showing items 21-40 of 92
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Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution
Van Beek, Simon; Rao, Siddharth; Kundu, Shreya; Kim, Woojin; O'Sullivan, Barry J.; Cosemans, Stefan; Yasin, Farukh; Carpenter, Robert; Couet, Sebastien; Sharifi, Shamin H.; Jossart, Nico; Crotti, Davide; Kar, Gouri (2021) -
Effect of tantalum spacer thickness and deposition conditions on the properties of MgO/CoFeB/Ta/CoFeB/MgO free layers
Devolder, Thibaut; Couet, Sebastien; Swerts, Johan; Mertens, Sofie; Rao, Siddharth; Kar, Gouri Sankar (2019) -
Efficient spin orbit torque switching in fully integrated synthetic antiferromagnetic free layers
Couet, Sebastien; Nguyen, Van Dai; Swerts, Johan; Rao, Siddharth; Kar, Gouri Sankar; Garello, Kevin (2019) -
Electrical modeling of STT-MRAM defects
Wu, Lizhou; Taouil, Mottaqiallah; Rao, Siddharth; Marinissen, Erik Jan; Hamdioui, Said (2018-11) -
Enablement of STT-MRAM as last level cache for the high performance computing domain at the 5nm node
Sakhare, Sushil; Perumkunnil, Manu; Huynh Bao, Trong; Rao, Siddharth; Kim, Woojin; Crotti, Davide; Yasin, Farrukh; Couet, Sebastien; Swerts, Johan; Kundu, Shreya; Yakimets, Dmitry; Baert, Rogier; Oh, Hyungrock; Spessot, Alessio; Mocuta, Anda; Kar, Gouri Sankar; Furnemont, Arnaud (2018) -
Enabling BEOL compatibility in top-pinned STT-MRAM
Carpenter, Robert; Swerts, Johan; Couet, Sebastien; Mertens, Sofie; Hon, Kwan; Liu, Enlong; Sankaran, Kiroubanand; Rao, Siddharth; Kim, Woojin; Garello, Kevin; Kundu, Shreya; Souriau, Laurent; Yasin, Farrukh; Houshmand Sharifi, Shamin; Van Elshocht, Sven; Crotti, Davide; Kar, Gouri Sankar (2019) -
Enabling CD SEM metrology for 5nm technology node and beyond
Lorusso, Gian; Ohashi, Takeyoshi; Yamaguchi, Astuko; Inoue, Osamu; Sutani, Takumichi; Horiguchi, Naoto; Boemmels, Juergen; Wilson, Chris; Briggs, Basoene; Tan, Chi Lim; Raymaekers, Tom; Delhougne, Romain; Van den Bosch, Geert; Di Piazza, Luca; Kar, Gouri Sankar; Furnemont, Arnaud; Fantini, Andrea; Donadio, Gabriele Luca; Souriau, Laurent; Crotti, Davide; Yasin, Farrukh; Appeltans, Raf; Rao, Siddharth; De Simone, Danilo; Rincon Delgadillo, Paulina; Leray, Philippe; Charley, Anne-Laure; Zhou, Daisy; Veloso, Anabela; Collaert, Nadine; Hasumi, Kazuhisa; Koshihara, Shunsuke; Ikota, Masami; Okagawa, Yutaka; Ishimoto, Toru (2017) -
Evidence of magnetostrictive effects on STT-MRAM performances by atomistic and spin modeling
Sankaran, Kiroubanand; Swerts, Johan; Carpenter, Robert; Couet, Sebastien; Garello, Kevin; Evans, Richard F. L.; Rao, Siddharth; Kim, Woojin; Kundu, Shreya; Crotti, Davide; Kar, Gouri Sankar; Pourtois, Geoffrey (2018) -
Experimental observation of back-hopping with reference layer flipping by high-voltage pulse in perpendicular magnetic tunnel junctions
Kim, Woojin; Couet, Sebastien; Swerts, Johan; Lin, Tsann; Tomczak, Yoann; Souriau, Laurent; Tsvetanova, Diana; Sankaran, Kiroubanand; Donadio, Gabriele Luca; Crotti, Davide; Van Beek, Simon; Rao, Siddharth; Goux, Ludovic; Kar, Gouri Sankar; Furnemont, Arnaud (2016) -
Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown
O'Sullivan, Barry; Van Beek, Simon; Roussel, Philippe; Rao, Siddharth; Kim, Woojin; Couet, Sebastien; Swerts, Johan; Yasin, Farrukh; Crotti, Davide; Linten, Dimitri; Kar, Gouri Sankar (2018) -
Feasibility analysis of embedded MRAM solutions at advanced process nodes
Perumkunnil, Manu; Gupta, Mohit; Rao, Siddharth; Kim, Woojin; Yasin, Farrukh; Couet, Sebastien; Furnemont, Arnaud; Kar, Gouri Sankar (2022) -
Field-Free Spin-Orbit Torque Driven Switching of Perpendicular Magnetic Tunnel Junction through Bending Current
Kateel, Vaishnavi; Krizakova, Viola; Rao, Siddharth; Cai, Kaiming; Gupta, Mohit; Gama Monteiro Junior, Maxwel; Yasin, Farrukh; Soree, Bart; De Boeck, Jo; Couet, Sebastien; Gambardella, Pietro; Kar, Gouri Sankar; Garello, Kevin (2023) -
First demonstration of field-free perpendicular SOT-MRAM for ultrafast and high-density embedded memories
Cai, Kaiming; Talmelli, Giacomo; Fan, Kaiquan; Van Beek, Simon; Kateel, Vaishnavi; Gupta, Mohit; Gama Monteiro Junior, Maxwel; Ben Chroud, Mohamed; Jayakumar, Ganesh; Trovato, Anna; Rao, Siddharth; Kar, Gouri Sankar; Couet, Sebastien (2022) -
High-density SOT-MRAM technology and design specifications for the embedded domain at 5nm node
Gupta, Mohit; Perumkunnil, Manu; Garello, Kevin; Rao, Siddharth; Yasin, Farrukh; Kar, Gouri Sankar; Furnemont, Arnaud (2020) -
Impact of ambient temperature on the switching behavior of voltage-controlled perpendicular magnetic tunnel junction
Wu, Jackson; Kim, Woojin; Van Beek, Simon; Couet, Sebastien; Carpenter, Robert; Rao, Siddharth; Kundu, Shreya; Yasin, Farrukh; Van Houdt, Jan; Groeseneken, Guido; Crotti, Davide; Kar, Gouri Sankar (2020) -
Impact of ambient temperature on the switching of voltage-controlled perpendicular magnetic tunnel junction
Wu, Jackson; Kim, Woojin; Van Beek, Simon; Couet, Sebastien; Carpenter, Robert; Rao, Siddharth; Kundu, Shreya; Van Houdt, Jan; Groeseneken, Guido; Crotti, Davide; Kar, Gouri Sankar (2021) -
Impact of Magnetic Coupling and Density on STT-MRAM Performance
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2020) -
Impact of operating temperature on the electrical and magnetic properties of the bottom-pinned perpendicular magnetic tunnel junctions
Wu, Jackson; Kim, Woojin; Rao, Siddharth; Garello, Kevin; Van Beek, Simon; Couet, Sebastien; Liu, Enlong; Swerts, Johan; Kundu, Shreya; Souriau, Laurent; Yasin, Farrukh; Crotti, Davide; Jochum, Johanna; Van Bael, Margriet; Van Houdt, Jan; Groeseneken, Guido; Kar, Gouri Sankar (2018-10) -
Impact of processing and stack optimization on the reliability of perpendicular STT-MRAM
Van Beek, Simon; Martens, Koen; Roussel, Philippe; Couet, Sebastien; Souriau, Laurent; Swerts, Johan; Kim, Woojin; Rao, Siddharth; Mertens, Sofie; Lin, Tsann; Crotti, Davide; Degraeve, Robin; Bury, Erik; Linten, Dimitri; Kar, Gouri Sankar; Groeseneken, Guido (2017) -
Impact of self-heating on reliability predictions in STT-MRAM
Van Beek, Simon; O'Sullivan, Barry; Roussel, Philippe; Degraeve, Robin; Bury, Erik; Swerts, Johan; Couet, Sebastien; Souriau, Laurent; Kundu, Shreya; Rao, Siddharth; Kim, Woojin; Yasin, Farrukh; Crotti, Davide; Linten, Dimitri; Kar, Gouri Sankar (2018)