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Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown
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Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown
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Date
2018
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
O'Sullivan, Barry
;
Van Beek, Simon
;
Roussel, Philippe
;
Rao, Siddharth
;
Kim, Woojin
;
Couet, Sebastien
;
Swerts, Johan
;
Yasin, Farrukh
;
Crotti, Davide
;
Linten, Dimitri
;
Kar, Gouri Sankar
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1984
since deposited on 2021-10-26
1
last month
Acq. date: 2026-02-27
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Statistics
Views
1984
since deposited on 2021-10-26
1
last month
Acq. date: 2026-02-27
Citations