Publication:

Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown

Date

2018
Proceedings Paper
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dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorVan Beek, Simon
dc.contributor.authorRoussel, Philippe
dc.contributor.authorRao, Siddharth
dc.contributor.authorKim, Woojin
dc.contributor.authorCouet, Sebastien
dc.contributor.authorSwerts, Johan
dc.contributor.authorYasin, Farrukh
dc.contributor.authorCrotti, Davide
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorYasin, Farrukh
dc.contributor.imecauthorCrotti, Davide
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecYasin, Farrukh::0000-0002-7295-0254
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-26T00:33:52Z
dc.date.available2021-10-26T00:33:52Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31462
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8353678
dc.source.beginpageP-MY.5
dc.source.conference2018 IEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate11/03/2018
dc.source.conferencelocationBurlingame, CA USA
dc.title

Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown

dc.typeProceedings paper
dspace.entity.typePublication
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