Impact of self-heating on reliability predictions in STT-MRAM

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Authors
Van Beek, Simon; O'Sullivan, Barry; Roussel, Philippe; Degraeve, Robin; Bury, Erik; Swerts, Johan; Couet, Sebastien; Souriau, Laurent; Kundu, Shreya; Rao, Siddharth; Kim, Woojin; Yasin, Farrukh; Crotti, Davide; Linten, Dimitri; Kar, Gouri Sankar
Conference
IEEE International Electron Devices Meeting - IEDM
Title
Impact of self-heating on reliability predictions in STT-MRAM
Publication type
Proceedings paper
Embargo date
9999-12-31
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