Publication:

Impact of self-heating on reliability predictions in STT-MRAM

Date

2018
Proceedings Paper
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dc.contributor.authorVan Beek, Simon
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorRoussel, Philippe
dc.contributor.authorDegraeve, Robin
dc.contributor.authorBury, Erik
dc.contributor.authorSwerts, Johan
dc.contributor.authorCouet, Sebastien
dc.contributor.authorSouriau, Laurent
dc.contributor.authorKundu, Shreya
dc.contributor.authorRao, Siddharth
dc.contributor.authorKim, Woojin
dc.contributor.authorYasin, Farrukh
dc.contributor.authorCrotti, Davide
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorSouriau, Laurent
dc.contributor.imecauthorKundu, Shreya
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorYasin, Farrukh
dc.contributor.imecauthorCrotti, Davide
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecSouriau, Laurent::0000-0002-5138-5938
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecYasin, Farrukh::0000-0002-7295-0254
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-26T06:22:50Z
dc.date.available2021-10-26T06:22:50Z
dc.date.embargo9999-12-31
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32009
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8614617
dc.source.beginpage592
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate1/12/2018
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage595
dc.title

Impact of self-heating on reliability predictions in STT-MRAM

dc.typeProceedings paper
dspace.entity.typePublication
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