Browsing by author "Hamdioui, Said"
Now showing items 41-60 of 87
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Fan-out enabled spin wave majority gate
Mahmoud, Abdulqader Nael; Vanderveken, Frederic; Adelmann, Christoph; Ciubotaru, Florin; Hamdioui, Said; Cotofana, Sorin (2020-03) -
Fan-out of 2 Triangle Shape Spin Wave Logic Gates
Mahmoud, Abdulqader; Adelmann, Christoph; Vanderveken, Frederic; Cotofana, Sorin; Ciubotaru, Florin; Hamdioui, Said (2021) -
Hardware-based aging mitigation scheme for memory address decoder
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2019) -
How significant will be the test cost share for 3D die-to-wafer stacked ICs?
Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan (2011-04) -
Impact and mitigation of sense amplifier aging degradation using realistic workloads
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2017) -
Impact and mitigation of SRAM read path aging
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (2018) -
Impact of Magnetic Coupling and Density on STT-MRAM Performance
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2020) -
Impact of mid-bond Testing in 3D stacked ICs
Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan; Bhawmik, Sudipta (2013-10) -
Impact of partial resistive defects and bias temperature instability on SRAM decoder reliability
Khan, Seyab; Taouil, Mottaqiallah; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky (2013) -
Impact of various test flows on the cost in 3D D2W stacking
Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan (2010-11) -
Incorporating parameter variations in BTI impact on nano-scale logical gate analysis
Khan, Seyab; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky (2012) -
Integral impact of BTI and voltage temperature variation on SRAM sense amplifier
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Kukner, H.; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2015) -
Integral Impact of BTI, PVT-variation and Workload on SRAM Sense Amplifier
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2017) -
Interconnect test for 3D stacked memory-on-logic
Taouil, Mottaqiallah; Masadeh, Mahmoud; Hamdioui, Said; Marinissen, Erik Jan (2014-03) -
Introduction to spin wave computing
Mahmoud, Abdulqader; Ciubotaru, Florin; Vanderveken, Frederic; Hamdioui, Said; Adelmann, Christoph; Cotofana, Sorin (2020-10) -
Low-power Memristor-based Computing for Edge-AI Applications
Singh, Abhairaj; Diware, Sumit; Gebregiorgis, Anteneh; Bishnoi, Rajendra; Catthoor, Francky; Joshi, Rajiv, V; Hamdioui, Said (2021) -
Manufacturing solutions
Evans, Adrian; Hamdioui, Said; Kaczer, Ben (2018) -
Methodology for application-dependent degradation analysis of memory timing
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2019) -
MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2022-01-04) -
Mitigation of sense amplifier degradation using input switching
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (2017)