Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Conference contributions
View item
imec Publications Repository
imec Publications
Conference contributions
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Impact of various test flows on the cost in 3D D2W stacking
Metadata
Show full item record
Authors
Taouil, Mottaqiallah
;
Hamdioui, Said
;
Marinissen, Erik Jan
Conference
IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits - 3D-TEST
Title
Impact of various test flows on the cost in 3D D2W stacking
Publication type
Proceedings paper
Collections
Conference contributions
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login