Integral impact of BTI and voltage temperature variation on SRAM sense amplifier

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Authors
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Kukner, H.; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky
Conference
IEEE 33rd VLSI Test Symposium - VTS
Title
Integral impact of BTI and voltage temperature variation on SRAM sense amplifier
Publication type
Proceedings paper
Embargo date
9999-12-31
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