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Integral impact of BTI and voltage temperature variation on SRAM sense amplifier

Date

2015
Proceedings Paper
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dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorHamdioui, Said
dc.contributor.authorKukner, H.
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.accessioned2021-10-22T18:29:58Z
dc.date.available2021-10-22T18:29:58Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24921
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7116291
dc.source.beginpage1
dc.source.conferenceIEEE 33rd VLSI Test Symposium - VTS
dc.source.conferencedate27/04/2015
dc.source.conferencelocationNapa, CA USA
dc.source.endpage6
dc.title

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier

dc.typeProceedings paper
dspace.entity.typePublication
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