Browsing by author "Hamdioui, Said"
Now showing items 21-40 of 87
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Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2020) -
Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2022) -
CIM-based Robust Logic Accelerator using 28 nm STT-MRAM Characterization Chip Tape-out
Singh, Abhairaj; Zahedi, Mahdi; Shahroodi, Taha; Gupta, Mohit; Gebregiorgis, Anteneh; Komalan, Manu; Joshi, Rajiv, V; Catthoor, Francky; Bishnoi, Rajendra; Hamdioui, Said (2022) -
Comparative analysis of RD and atomistic trap-based BTI models on SRAM sense amplifier
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Cosemans, Stefan; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2015) -
Comparative BTI analysis for various sense amplifier designs
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky (2016) -
Comparative BTI impact for SRAM cell and sense amplifier designs
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky; Dehaene, Wim (2015) -
Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates
Kukner, Halil; Khan, Seyab; Weckx, Pieter; Raghavan, Praveen; Hamdioui, Said; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2014) -
Cost modeling for 2.5D and 3D stacked ICs
Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan (2019-03) -
Defect and Fault Modeling Framework for STT-MRAM Testing
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Medeiros, Guilherme Cardoso; Fieback, Moritz; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2021) -
Degradation analysis of high performance 14nm FinFET SRAM
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2018) -
Device aging: A reliability and security concern
Kraak, Daniel; Mottaqiallah, Taouil; Hamdioui, Said; Weckx, Pieter; Catthoor, Francky; Chatterjee, Abhijit; Singh, Adit; Wunderlich, Joachim; Karimi, Naghmeh (2018) -
Device Aware Diagnosis for Unique Defects in STT-MRAMs
Aouichi, Ahmed; Yuan, Sicong; Fieback, Moritz; Rao, Siddharth; Kim, Woojin; Marinissen, Erik Jan; Couet, Sebastien; Taouil, Mottaqiallah; Hamdioui, Said (2023) -
Device-Aware Test for Back-Hopping Defects in STT-MRAMs
Yuan, Sicong; Taouil, Mottaqiallah; Fieback, Moritz; Xun, Hanzhi; Marinissen, Erik Jan; Kar, Gouri Sankar; Rao, Siddharth; Couet, Sebastien; Hamdioui, Said (2023) -
Device-aware test: A new test approach towards DPPB
Fieback, Moritz; Wu, Lizhou; Cardoso Medeiros, Guilherme; Aziza, Hassen; Rao, Siddharth; Marinissen, Erik Jan; Taouil, Mottaqiallah; Hamdioui, Said (2019-11) -
Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface
Marinissen, Erik Jan; De Wachter, Bart; Smith, Ken; Kiesewetter, Joerg; Taouil, Mottaqiallah; Hamdioui, Said (2014-10) -
Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface
Marinissen, Erik Jan; De Wachter, Bart; Smith, Ken; Kiesewetter, Joerg; Taouil, Mottaqiallah; Hamdioui, Said (2014-10) -
Electrical modeling of STT-MRAM defects
Wu, Lizhou; Taouil, Mottaqiallah; Rao, Siddharth; Marinissen, Erik Jan; Hamdioui, Said (2018-11) -
Energy-efficient In-Memory Address Calculation
Yousefzadeh, Amirreza; Stuijt, Jan; Hijdra, Martijn; Liu, Hsiao-Hsuan; Gebregiorgis, Anteneh; Singh, Abhairaj; Hamdioui, Said; Catthoor, Francky (2022) -
eSRAM Reliability: Why is it still not optimally solved?
Kraak, Daniel; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2020) -
Estimation of sense amplifier offset voltage degradation due to zero- and run-time variability
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2017)