An in-depth and black- box characterization of the effects of laser pulses on ATmega328P

dc.contributor.author	Kumar, D.S.
dc.contributor.author	Beckers, A.
dc.contributor.author	Balasch, J.
dc.contributor.author	Gierlichs, B.
dc.contributor.author	Verbauwhede, I.
dc.date.accessioned	2021-10-27T11:53:25Z
dc.date.available	2021-10-27T11:53:25Z
dc.date.embargo	9999-12-31
dc.date.issued	2019
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/33346
dc.identifier.url	https://doi.org/10.1007/978-3-030-15462-2_11
dc.source.beginpage	156
dc.source.conference	Smart Card Research and Advanced Applications - CARDIS 2018
dc.source.conferencedate	12/11/2018
dc.source.conferencelocation	Montpellier France
dc.source.endpage	170
dc.title	An in-depth and black- box characterization of the effects of laser pulses on ATmega328P
dc.type	Proceedings paper
dspace.entity.type	Publication
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