Publication:

Transient and end silicide phase formation in thin film Ni/polycrystalline-Si reactions for fully-silicided gate applications

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1911 since deposited on 2021-10-16
Acq. date: 2026-03-17

Citations

Statistics

Views

1911 since deposited on 2021-10-16
Acq. date: 2026-03-17

Citations